Thin Film Reflectometry System, Thin film thickness measurement
¹Ú¸·µÎ²²ÃøÁ¤, ³ª³ë¹Ú¸· µÎ²²ÃøÁ¤, ¹Ú¸·±¼ÀýÀ² ÃøÁ¤
Protein spots on glass
PCBM on SiO2
SAM/SAM pattern
Solar cell on PET
Transparent substrate
Liquid/liquid interface
PMMA film on Si-Wafer
Monolayer
Imaging ellipsometry, Spectroscopic ellipsometry
Surface plasmon resonance analyzer
ÁÖ¿ä Ư¡
Direct sample visualization with an ellipsometric contrast image with a lateral resolution as small as 1 micron
Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
Real time ellipsometric contrast images provide a fast view of the surface, any defects or structures Parallel measurement of multiple areas within the selected field of view
Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates
07072 ¼¿ï½Ã µ¿ÀÛ±¸ ½Å´ë¹æ1°¡±æ 38 (½Å´ë¹æ 719¹øÁö µ¿Àۻ󶼺ô) 106µ¿ 209È£ (ÁÖ)¿ø¿ì½Ã½ºÅÛÁî TEL : 02-533-6720 FAX : 02-533-9614 Santevill 106-209, 38, Sindaebang1ga-gil, Dongjak, Seoul, 07072, South Korea
Copyright 2000-2023 Wonwoo Systems Co.,Ltd. All right reserved