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Insight LIBS
High-Sensitivity Microanalysiscklo
 
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  • Little or no sample preparation
  • Multiple elements simultaneously, including light elements (Z<12) such as C, H, Li, B, and Be
  • Surface mapping
  • Depth profiling
  • Micro- to Macro-analysis
  • Qualitative or Quantitative
  • Material classification
LIBS-INSIGHT-150MJ LIBS-INSIGHT-50MJ
High-end LIBS platform with 150 mJ laser High-end LIBS platform with 50 mJ laser
Rugged Nd:YAG laser, sensitive echelle spectrometer
Built-in timing control circuit synchronizes laser and spectrometer
Confocal video and laser planes ensure measurement repeatability
Purged sample chamber
 
 
 
 
 
07072 ¼­¿ï½Ã µ¿ÀÛ±¸ ½Å´ë¹æ1°¡±æ 38 (½Å´ë¹æ 719¹øÁö µ¿Àۻ󶼺ô) 106µ¿ 209È£ (ÁÖ)¿ø¿ì½Ã½ºÅÛÁî
TEL : 02-533-6720  FAX : 02-533-9614
Santevill 106-209, 38, Sindaebang1ga-gil, Dongjak, Seoul, 07072, South Korea
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