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Nanofilm EP4
The next generation in imaging ellipsometry
제조사 수입
원산지 독일
Accurion사의 2D Imaging Ellipsometer, nanofilm EP4를 소개합니다.

Auto nulling ellipsometry 와 Microscopy 기술 결합으로 1마이크론 정도의 수평해상도로
박막 표면 특성 분석이 가능한 제품입니다.
대부분의 Micro spot 분광옵션을 적용한 Non-imaging ellipsometer와 비교해도
1000배나 작은 Sample area에 대한 분석이 가능합니다.

적용 분야
  • Graphene
  • Nano materials 구조
  • Thin Film Reflectometry System, Thin film thickness measurement
  • 박막두께측정, 나노박막 두께측정, 박막굴절율 측정
  • Protein spots on glass
  • PCBM on SiO2
  • SAM/SAM pattern
  • Solar cell on PET
  • Transparent substrate
  • Liquid/liquid interface
  • PMMA film on Si-Wafer
  • Monolayer
  • Imaging ellipsometry, Spectroscopic ellipsometry
  • Surface plasmon resonance analyzer​

    주요 특징
  • Direct sample visualization with an ellipsometric contrast image with a lateral resolution as small as 1 micron
  • Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
  • High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
  • Real time ellipsometric contrast images provide a fast view of the surface, any defects or structures
    Parallel measurement of multiple areas within the selected field of view
  • Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates

    07072 서울시 동작구 신대방1가길 38 (신대방 719번지 동작상떼빌) 106동 209호 (주)원우시스템즈
    TEL : 02-533-6720, 02-3289-1290  FAX : 02-3289-1293
    Santevill 106-209, 38, Shindaebang1ga-gil, Dongjak, Seoul, 07072, South Korea
    Copyright 2000-2017 Wonwoo Systems Co.,Ltd. All right reserved